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Scanning Tunneling Microscope and Atomic Force Microscopy

Sharma, Suchit
Scanning Tunneling Microscope and Atomic Force Microscopy
Literature Review from the year 2015 in the subject Engineering - General, Basics, Indian Institute of Technology, Delhi, course: Mineral Engineering, language: English, abstract: Atomic-scale resolution is needed to study the arrangement of atoms in materials and advancing their understanding. Since the seventeenth-century optical microscopes using visible light as illumination source have led our quest to observe microscopic species but the ...

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